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SIFT-MS: A Revolution in Rapid Trace Gas and Headspace Analysis

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Location

BAM

Unter den Eichen 44-46

12203 Berlin

Germany

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Description

Syft Technologies, Holtkamp Air Quality Improvement and BAM (German Federal Institute for Materials Research and Testing) invite you to attend a one-day seminar on real-time trace gas analysis of volatile organic
compounds and inorganic gases. Learn how SIFT-MS is revolutionising trace analysis across a wide range of applications.

Programme

  • 10:00: Welcome with Coffee and Tea
  • 10:30: Introduction to Syft Technologies and Selected Ion Flow Tube Mass Spectrometry
  • 11:00: Live demonstration: comprehensive gas analysis in realtime
  • 11:30: Presentation from BAM division "Materials and Air Pollutants"
  • 12:00: Lunch break (catering provided)
  • 13:00: Live demonstration
  • 13:30: Applications of SIFT-MS: from environmental and pharmaceutical analysis to food and material testing
  • 14:00: Live demonstration: Analysis of customer samples
  • 14:30: Closing discussion with Q&A
  • 15:00: Finish

The majority of this event will be held in German, for more information please contact David Hera at Syft Technologies david.hera@syft.com.

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Date and Time

Location

BAM

Unter den Eichen 44-46

12203 Berlin

Germany

View Map

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